A while back in late 2016/early 2017, we faced the following problem: Let’s assume you have a set of online concurrent checkers (regardless of how they are generated!), and you want to deploy a subset of them (which can be as big as the original set) on a chip. You have two factors; Fault coverage …
So a while back I made a script which would generate a user defined test pattern for small circuits (or rather for small number of input combinations). The program gets the inputs as small chunks defined by the user (such as all ones, all zeros, one-hot, defined binary numbers etc.). I later use Itertools for making …